OBLF VeOSSpark Emission Spectrometer for Versatile Applications
Featuring cutting-edge detector technology on the basis of semiconductor detectors that were specially developed for emission spectroscopy, OBLF's VeOS spark emission spectrometer enables versatile, flexible and quick analysis of all common metallic materials. The analytical spectrum also includes the precise analysis of short-wave elements like sulphur, phosphorous, nitrogen, carbon (incl. ULC) in steel or cast iron and phosphorous in aluminium.
OBLF's Veos is the first spark spectrometer to feature a semiconductor- based detector system whose analytical performance - including the spectral resolution required for a laboratory spectrometer - is every bit as good as established photomultiplier-based systems. This brand new photo-detector technology was specifically developed for spark emission spectroscopy and guarantees excellent results over the entire required wavelength range of 130 to 780 nm. The design of the light-sensitive detectors, which are characterised by a surface that is 100 times more light sensitive than detectors found in conventional systems, was specially adapted to suit the requirements of emission spectroscopy.
As a result, this is the first device to offer the best possible combination of spectral sensitivity and spectral resolution along with an innovative design that both guarantees OBLF's well-known quality and the greatest flexibility of use.